Local Recovery and Failure Masking for Stencil-based Applications at Extreme Scales

TitleLocal Recovery and Failure Masking for Stencil-based Applications at Extreme Scales
Publication TypeConference Paper
Year of Publication2015
AuthorsGamell M, Teranishi K, Heroux MA, Mayo J, Kolla H, Chen J, Parashar M
Conference NameProceedings of the International Conference for High Performance Computing, Networking, Storage and Analysis
PublisherACM
Conference LocationNew York, NY, USA
ISBN Number978-1-4503-3723-6
Keywordsfault-tolerance, performance modeling, scalable methods
URLhttp://doi.acm.org/10.1145/2807591.2807672
DOI10.1145/2807591.2807672